Figure 2

Download original image
Structural comparison of NCM622, NM64 and Co-NM64. (a) SEM images of Co-NM64. (b) EDS line profile along the arrow. (c) EDS mapping of Co in the cross section. (d–f) XRD diffraction and refinement of NCM622 (d), NM64 (e) and Co-NM64 (f). (g1–i1) Surface scanning transmission electron microscopy under high-angle annular dark-field mode (HAADF-STEM) image of NCM622 (g1), NM64 (h1) and Co-NM64 (i1). (g2–i2) Bulk HAADF-STEM image of NCM622 (g2), NM64 (h2) and Co-NM64 (i2). (j) HAADF-STEM image of Co-NM64 marked by yellow and green boxes. (k–l) Corresponding HAADF signal profiles of the yellow and green boxes in (j). Scale bars, 200 nm (a), 2 μm (an inset), 50 nm (b,c), 2 nm (g–j).
Current usage metrics show cumulative count of Article Views (full-text article views including HTML views, PDF and ePub downloads, according to the available data) and Abstracts Views on Vision4Press platform.
Data correspond to usage on the plateform after 2015. The current usage metrics is available 48-96 hours after online publication and is updated daily on week days.
Initial download of the metrics may take a while.