(A) Transmission electron microscopy (TEM) image of the antiparallel twisted double bilayer WSe₂. (B) Electron diffraction pattern taken from the area in (A). The twist angle is determined to be about 3.8°. (C) An enlarged image of the region marked by the white dashed rectangle in (A). The positions of exact 2H stacking are marked by yellow hexagons (dashed lines). The white thick arrows indicate the directions of the 2H registry shifts. The scale bar is 3 nm.