Working modes of new electron microscopy techniques. (a) Schematic of the 4D-EELS experimental setup for phonon dispersion curves, with a slot aperture placed parallel to the cBN-diamond interface, producing dispersion diagrams along the Γ-Σ-K-X high-symmetry line [7]. (b) Schematic of the 4D-STEM setup, where a convergent electron beam scans the sample point by point, collecting diffraction patterns to form a 4D-STEM dataset for ptychography [9]. (c) Schematic of the MEMS chip with eight electrical contacts for thermoelectric in-situ TEM characterization, with contacts for dual-probe electrical characteristics and two groups of heating elements and temperature sensors [10].