Transmission electron microscope (TEM) analysis of Ag₂Se_0.9Te_0.1 sample with a compression strain 10%. (A) Bright-field image showing typical dislocations marked by red arrows. (B) HRTEM image and corresponding FFT image highlighting the dislocation array. (C) HRTEM image illustrating two sub-grains; inset images are FFT images. (D) Grain interface of the red area in Panel (C); two sets of planes are marked as red and yellow dots, respectively.